Generation of Single Input Change Test Sequences for Conformance Test of Programmable Logic Controllers
نویسندگان
چکیده
منابع مشابه
Hardware Generation of Random Single Input Change Test Sequences
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. As delay testing using external testers requires expensive ATE, built-in self test (BIST) is an alternative technique that can significantly reduce the test cost. It has been proven that Single Input Change (SIC) test s...
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The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. As delay testing using external testers requires expensive ATE, built-in self test (BIST) is an alternative technique that can significantly reduce the test cost. It has been proven that Single Input Change (SIC) test s...
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ژورنال
عنوان ژورنال: IEEE Transactions on Industrial Informatics
سال: 2014
ISSN: 1551-3203,1941-0050
DOI: 10.1109/tii.2014.2315972